DocumentCode :
3084706
Title :
Defect type and its impact on the growth curve [software development]
Author :
Chillarege, Ram ; Kao, Wei-Lun ; Condit, Richard G.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1991
fDate :
13-16 May 1991
Firstpage :
246
Lastpage :
255
Abstract :
The authors present an empirical investigation on possible cause and effect relationships between defects and the software development process. The authors use defect data from an operating systems development project and find that initialization defects are strongly related to the inflection noticed in the reliability growth. The defect type distribution identified process problems that concurred with the developer´s hindsight. Thus, it is shown that it is plausible that there exist other cause-effect relationships that could be identified. This finding could pave the way for a more systematic process control methodology to be applied to software development
Keywords :
software reliability; cause-effect relationships; defect type; growth curve; inflection; initialization defects; operating systems development project; reliability; software development; software development process; systematic process control methodology; Area measurement; Availability; Manufacturing processes; Marine vehicles; Operating systems; Process control; Programming; Software measurement; Testing; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, 1991. Proceedings., 13th International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-2140-0
Type :
conf
DOI :
10.1109/ICSE.1991.130649
Filename :
130649
Link To Document :
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