• DocumentCode
    3084786
  • Title

    Transport of heat and electricity in p-n semiconductor structures

  • Author

    Gurevich, Yuri G. ; Lashkevych, Igor

  • Author_Institution
    Dept. de Fis., CINVESTAV-I.P.N. Apdo., Mexico City, Mexico
  • fYear
    2012
  • fDate
    26-28 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The paper is devoted to the analysis of thermoelectric cooling phenomena in a p-n semiconductor structure. The formulation of an adequate self-consistent theoretical model describing the effect is presented. The role of the recombination rate as a new source of heat in linear approximation of the electric current was discussed, leading to a reformulation of the heat balance equations. The importance of redistribution of nonequilibrium charge carriers, which has been ignored in most publications on this subject, is also shown. Moreover, it is proved that the thermoelectric cooling in the conventional theory, which does not take into account the influence of the nonequilibrium charge carriers, is not correct. In the present work it is demonstrated that the Peltier effect strongly depends on the recombination rate. In particular, it is shown that the sign of the Peltier effect changes with the value of the recombination rate.
  • Keywords
    Peltier effect; semiconductor technology; thermoelectric cooling; Peltier effect; electric current; electricity transport; heat balance equation reformulation; heat transport; linear approximation; nonequilibrium charge carrier redistribution; recombination rate; semiconductor structures; thermoelectric cooling phenomena; Boundary conditions; Charge carrier processes; Cooling; P-n junctions; Radiative recombination; Resistance heating; nonequilibrium charge carriers; recombination; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering, Computing Science and Automatic Control (CCE), 2012 9th International Conference on
  • Conference_Location
    Mexico City
  • Print_ISBN
    978-1-4673-2170-9
  • Type

    conf

  • DOI
    10.1109/ICEEE.2012.6421109
  • Filename
    6421109