Title : 
Correlations of diffusion tensor imaging values and symptom scores in patients with schizophrenia
         
        
            Author : 
Michael, Andrew M. ; Calhoun, Vince D. ; Pearlson, Godfrey D. ; Baum, Stefi A. ; Caprihan, Arvind
         
        
            Author_Institution : 
Rochester Institute of Technology, NY 14623, USA
         
        
        
        
        
        
            Abstract : 
Abnormalities in white matter (WM) brain regions are attributed as a possible biomarker for schizophrenia (SZ). Diffusion tensor imaging (DTI) is used to capture WM tracts. Psychometric tests that evaluate the severity of symptoms of SZ are clinically used in the diagnosis process. In this study we investigate the correlates of scalar DTI measures, such as fractional anisotropy, mean diffusivity, axial diffusivity, and radial diffusivity with behavioral test scores. The correlations were found by different schemes: mean correlation with WM atlas regions and multiple regression of DTI values with test scores. The corpus callosum, superior longitudinal fasciculus right and inferior longitudinal fasciculus left were found to be having high correlations with test scores.
         
        
            Keywords : 
Anisotropic magnetoresistance; Biomarkers; Density measurement; Diffusion tensor imaging; Magnetic resonance imaging; Microscopy; Nerve fibers; Psychometric testing; Size measurement; Tensile stress; Adult; Brain; Diffusion Magnetic Resonance Imaging; Humans; Image Interpretation, Computer-Assisted; Nerve Fibers, Myelinated; Neuropsychological Tests; Psychometrics; Reproducibility of Results; Schizophrenia; Sensitivity and Specificity; Statistics as Topic;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Vancouver, BC
         
        
        
            Print_ISBN : 
978-1-4244-1814-5
         
        
            Electronic_ISBN : 
1557-170X
         
        
        
            DOI : 
10.1109/IEMBS.2008.4650458