• DocumentCode
    3084937
  • Title

    Power-noise measurements of small-scale inverter chains

  • Author

    Harada, Y. ; Yoshikawa, Kenichi ; Miura, Naruhisa ; Nagata, M. ; Murata, Atsuo ; Agatsuma, Shuji ; Ichikawa, Kazuhisa

  • Author_Institution
    Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan
  • fYear
    2013
  • fDate
    5-6 June 2013
  • Firstpage
    102
  • Lastpage
    103
  • Abstract
    This paper presents the measurements of power noise (Vdd noise) waveforms of a 5-stage inverter chain, using on-chip noise monitor circuits (OCM). The fine resolution of 0.4 mV in voltage and 12.5 ps in timing are realized. The undesired voltage variation by signal buffers in I/O cells is carefully eliminated by three means; (i) isolation of power domains, (ii) subtraction of background noise waveforms, and (iii) averaging iteratively captured waveforms.
  • Keywords
    circuit noise; invertors; noise measurement; waveform analysis; 5-stage inverter chain; I/O cells; OCM; background noise waveforms; iteratively captured waveforms; on-chip noise monitor circuits; power-noise measurements; signal buffers; small-scale inverter chains; Inverters; Noise; Noise measurement; Power measurement; Power supplies; Semiconductor device measurement; System-on-chip; On chip measurement; Power integrity; Power supply noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai (IMFEDK), 2013 IEEE International Meeting for
  • Conference_Location
    Suita
  • Print_ISBN
    978-1-4673-6106-4
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2013.6602259
  • Filename
    6602259
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3084937