Title :
Contribution and control of neutral gas absorption effects in the plasma doping of boron into Si
Author :
Tsutsui, K. ; Higaki, R. ; Sasaki, Y. ; Sato, Takao ; Tamura, H. ; Mizuno, B. ; Iwai, H.
Author_Institution :
Interdisciplinary Graduate Sch. of Sci. & Eng., Tokyo Inst. of Technol., Japan
Abstract :
In the low energy plasma doping process, the contribution of not only ionized species but also neutral species to the doping process should be considered. In order to investigate such a contribution, the experiments of gas phase doping combined with Ar or He plasma pre-treatment were carried out. Gas phase impurity absorption should be affected by surface condition of Si substrates. As a result, significant increase of boron dose from neutral gas phase was observed when the substrate surface was pre-treated by Ar or He plasma prior to exposure to neutral B2H6/He gas. It was also found that the gas phase impurity absorption was affected by substrate temperature when the surface was exposed to the neutral B2H6/He gas.
Keywords :
boron; elemental semiconductors; ion implantation; semiconductor doping; silicon; Si:B; gas phase doping; ionized species; neutral gas absorption effects; neutral species; plasma doping; Absorption; Argon; Boron; Doping; Helium; Nuclear and plasma sciences; Plasma chemistry; Plasma immersion ion implantation; Plasma measurements; Plasma sources;
Conference_Titel :
Junction Technology, 2004. IWJT '04. The Fourth International Workshop on
Print_ISBN :
0-7803-8191-2
DOI :
10.1109/IWJT.2004.1306755