DocumentCode :
3085377
Title :
InGaAs MOSFETs for CMOS: Recent advances in process technology
Author :
del Alamo, Jesus A. ; Antoniadis, D. ; Guo, Anjin ; Kim, Do-Hyeon ; Kim, Tae-Woo ; Lin, James ; Lu, Wenchao ; Vardi, Alon ; Zhao, Xingang
Author_Institution :
Microsyst. Technol. Labs., MIT, Cambridge, MA, USA
fYear :
2013
fDate :
9-11 Dec. 2013
Abstract :
InGaAs has recently emerged as the most attractive non-Si n-channel material for future nano-scale CMOS. InGaAs n-channel MOSFETs promise to advance Moore´s Law by allowing continued scaling through a reduction in footprint and operating voltage without compromising performance. This paper reviews recent advances in some of the key enabling process technology of InGaAs MOSFETs. It also outlines some of the challenges that need to be overcome before this new device family can become a reality.
Keywords :
CMOS integrated circuits; III-V semiconductors; MOSFET; gallium arsenide; indium compounds; nanoelectronics; InGaAs; Moore law; n-channel MOSFETs; nanoscale CMOS; nonsilicon n-channel material; process technology; HEMTs; Indium gallium arsenide; Indium phosphide; Logic gates; MODFETs; MOSFET;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEDM.2013.6724541
Filename :
6724541
Link To Document :
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