Title :
Length, scaling, and material dependence of crosstalk between distributed RC interconnects
Author :
Davis, Jeff A. ; Meindl, James D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
New general expressions for the transient response time and peak crosstalk of coupled distributed RC interconnects driven by a voltage source with finite rise-time and source impedance are presented. New compact expressions for peak crosstalk voltage reveal a previously unrecognized strong dependence of crosstalk on interconnect length, scaling, driver impedance, and materials properties for typical rise-time dominant interconnect circuits
Keywords :
crosstalk; electric impedance; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; transient response; coupled distributed RC interconnects; crosstalk; distributed RC interconnects; driver impedance; finite rise-time; finite source impedance; interconnect length; interconnect material dependence; interconnect scaling; peak crosstalk; peak crosstalk voltage; rise-time dominant interconnect circuits; transient response time; voltage source; Coupling circuits; Crosstalk; Driver circuits; Genetic expression; Impedance; Integrated circuit interconnections; Material properties; Time factors; Transient response; Voltage;
Conference_Titel :
Interconnect Technology, 1999. IEEE International Conference
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5174-6
DOI :
10.1109/IITC.1999.787129
