Title :
Silicon carbide (SiC) nanoelectromechanical switches and logic gates with long cycles and robust performance in ambient air and at high temperature
Author :
He, Tian ; Rui Yang ; Ranganathan, Vaishnavi ; Rajgopal, Srihari ; Tupta, Mary Anne ; Bhunia, Swarup ; Mehregany, Mehran ; Feng, Philip X.-L
Author_Institution :
Electr. Eng., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
We demonstrate nanoelectromechanical contact-mode switches and logic gates with high performance, enabled by cantilever-structured SiC nanoelectromechanical systems (NEMS). In full-cycle recording measurements (complete time-domain trace of every single switching cycle recorded), we show that in ambient air, SiC NEMS switches with nanocontacts have operated >1×107 cycles of `hot-switching´ without failure (devices still alive). When only recording valid `on´/`off´ states (without the complete trace, to avoid overflowing data recording and to speed up acquisition), >2×1010 cycles have been measured. These clearly exhibit the unique properties and advantages of SiC NEMS, amongst all contact-mode, genuinely nanoscale switches. We also show robust switching events at high temperature T~500°C.
Keywords :
cantilevers; logic gates; nanoelectromechanical devices; silicon compounds; switches; wide band gap semiconductors; NEMS switch; SiC; cantilever structured nanoelectromechanical systems; full cycle recording measurements; logic gates; nanoelectromechanical contact mode switches; silicon carbide nanoelectromechanical switches; temperature 500 C; Current measurement; Logic gates; Nanoelectromechanical systems; Silicon carbide; Switches; Temperature measurement; Voltage measurement;
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.2013.6724562