DocumentCode
3085875
Title
Analysis of spontaneous MEG activity in Alzheimer´s disease using time-frequency parameters
Author
Poza, Jesús ; Hornero, Roberto ; Escudero, Javier ; Fernández, Alberto ; Gómez, Carlos
Author_Institution
Biomedical Engineering Group (GIB), Dpt. TSCIT, University of Valladolid, Camino del Cementerio s/n, 47011, Spain
fYear
2008
fDate
20-25 Aug. 2008
Firstpage
5712
Lastpage
5715
Abstract
The aim of this study was to explore the ability of several time-frequency parameters to discriminate between spontaneous magnetoencephalographic (MEG) oscillations from 20 Alzheimer´s disease (AD) patients and 21 controls. The spectral crest factor (SCF) and the spectral turbulence (ST) were calculated from the time-frequency distribution of the normalized power spectral density averaged over all MEG sensors. Results revealed statistically significant higher SCF and ST mean values for AD patients than controls (p < 0.05). This fact suggests a significant decrease in irregularity of AD patients´ MEG activity. The standard deviation of SCF also provided significant differences (p < 0.05). This result indicates that AD patients showed a significantly higher variability than controls. The highest accuracy of 85.4% (90.5% sensitivity, 80.0% specificity) was achieved using simultaneously the mean value and the standard deviation of the SCF. We conclude that the variability of the spectral parameters can yield complementary information to the mean values, useful to help in AD detection.
Keywords
Alzheimer´s disease; Character generation; Drugs; Electroencephalography; Magnetic analysis; Scalp; Signal analysis; Signal generators; Synchronous generators; Time frequency analysis; Adult; Algorithms; Alzheimer Disease; Biological Clocks; Brain; Diagnosis, Computer-Assisted; Female; Humans; Magnetoencephalography; Male; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location
Vancouver, BC
ISSN
1557-170X
Print_ISBN
978-1-4244-1814-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2008.4650511
Filename
4650511
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