• DocumentCode
    3086117
  • Title

    InGaP/InGaAs dual-channel transistor

  • Author

    Chuang, Hung-Ming ; Uang, Chii-Maw ; Cheng, Shiou-Ying ; Chen, Chun-Yuan ; Lai, Po-Hsien ; Kao, Chung-I ; Tsai, Ym-Ying ; Hsu, Wei-Hsi ; Liu, Wen-Chau

  • Author_Institution
    Dept. of Electr. Eng., Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2004
  • fDate
    15-16 March 2004
  • Firstpage
    186
  • Lastpage
    189
  • Abstract
    An interesting InGaP/InGaAs heterostructure field-effect transistor utilizing dual δ-doped quantum wells as double channels is studied and demonstrated. The employed dual δ-doped quantum wells and InGaP layer provide good carrier confinement and Schottky behavior, respectively. Good device performances including higher turn-on and breakdown voltages, high and linear transconductance and RF properties are obtained. For a 1 × 100 μm device, turn-on voltage of 1.74 V, maximum output current of 499 mA/mm, and maximum transconductance of 162 mS/mm with 303 mA/mm broad operation regime are obtained. The microwave properties of fT and fmax are 16 and 32.3 GHz, respectively. Furthermore, even the device is operated at higher temperature regime (>400K), insignificant degradations of DC and RF performances are observed.
  • Keywords
    III-V semiconductors; Schottky barriers; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; semiconductor device breakdown; semiconductor heterojunctions; semiconductor quantum wells; 1 micron; 1.74 V; 100 micron; 16 GHz; 162 mS/mm; 32.3 GHz; 400 K; InGaP/InGaAs dual-channel transistor; RF properties; Schottky behavior; breakdown voltages; carrier confinement; device performances; double channels; dual δ-doped quantum wells; heterostructure field-effect transistor; linear transconductance; turn-on voltages; Carrier confinement; Degradation; HEMTs; Indium gallium arsenide; MODFETs; Microwave devices; Radio frequency; Temperature; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2004. IWJT '04. The Fourth International Workshop on
  • Print_ISBN
    0-7803-8191-2
  • Type

    conf

  • DOI
    10.1109/IWJT.2004.1306790
  • Filename
    1306790