Title :
Multiple fault diagnosis of analog circuits by locating ambiguity groups of test equation
Author :
Starzyk, J.A. ; Liu, D.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Abstract :
This paper proposes a method to diagnose the multiple faults in linear analog circuits. The test equation establishes the relationship between the measured responses and faulty excitations due to faulty elements. The QR factorization is applied to identify ambiguity groups in the test verification matrix. The suspicious faulty excitations of the minimum size are determined. Faulty parameters are evaluated using the structural incident signal matrix. Finally, this method is illustrated with an example circuit
Keywords :
analogue circuits; analogue integrated circuits; circuit analysis computing; circuit testing; fault diagnosis; integrated circuit testing; matrix decomposition; QR factorization; ambiguity group identification; analogue circuit testing; faulty parameters evaluation; linear analog circuits; multiple fault diagnosis; structural incident signal matrix; test equation ambiguity groups; test verification matrix; Analog circuits; Automation; Circuit faults; Circuit testing; Computer science; Electrical fault detection; Equations; Fault detection; Fault diagnosis; Voltage measurement;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922019
