• DocumentCode
    3086383
  • Title

    Pointwise gap metrics on transfer matrices

  • Author

    Qiu, L. ; Davison, E.J.

  • Author_Institution
    Dept. of Electr. Eng., Toronto Univ., Ont., Canada
  • fYear
    1990
  • fDate
    5-7 Dec 1990
  • Firstpage
    2431
  • Abstract
    A new family of metrics, called pointwise gap metrics, in the space of real rational matrices of fixed size is developed. These metrics are then used to study open-loop and closed-loop stability robustness of lumped linear time-invariant finite-dimensional continuous-time systems. It is shown that pointwise gap metrics have the desired qualitative properties for the study of stability robustness. Necessary and sufficient conditions on the open- and closed-loop stability robustness are obtained in terms of the radii of the pointwise gap metric balls centered at the nominal plant and/or the nominal controller. The new metric is compared with the available metrics, e.g. the gap metric and the graph metric. All these metrics induce the same topology. It is shown that many of the quantitative properties of pointwise gap metrics are the same as those of the gap metric, although they differ in value. In the scalar case they have a very simple expression which is potentially useful for accessing the relationship between the uncertainty of physical parameters and the uncertainty measured by pointwise gap metrics
  • Keywords
    closed loop systems; control system analysis; matrix algebra; stability criteria; closed loop systems; finite-dimensional continuous-time systems; necessary conditions; open loop systems; pointwise gap metrics; robustness; stability; sufficient conditions; time invariant systems; transfer matrices; uncertainty; Feedback loop; Measurement uncertainty; Open loop systems; Robust control; Robust stability; Size measurement; Stability analysis; Sufficient conditions; Topology; Uncertain systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1990., Proceedings of the 29th IEEE Conference on
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/CDC.1990.204061
  • Filename
    204061