Title :
Selector-less ReRAM with an excellent non-linearity and reliability by the band-gap engineered multi-layer titanium oxide and triangular shaped AC pulse
Author :
Sangheon Lee ; Daeseok Lee ; Jiyong Woo ; Euijun Cha ; Jeonghwan Song ; Jaesung Park ; Hyunsang Hwang
Author_Institution :
Dept. of Mater. Sci. & Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
Abstract :
The effect of oxygen profile control of a multi-layer TiOx on tunnel barrier characteristics has been investigated to achieve high non-linearity, endurance, and uniformity of a selector-less ReRAM. By optimizing oxygen profile of TiOx layer in the selector-less ReRAM, non-linearity and a readout margin (low ILRS at ½VRead) have been significantly improved compared with 1S1R-type devices and non-linear ReRAMs (Figs. 1-2) [2]-[5]. In addition, AC behaviors of the selector-less ReRAM have been investigated with various AC pulse shape to realize the AC operation of the selector-less ReRAM in cross-point array. Hence, significantly improved AC switching reliability of the selector-less ReRAM was obtained by adopting triangular AC pulse shapes for both set and reset mode.
Keywords :
integrated circuit reliability; random-access storage; titanium compounds; 1S1R-type devices; AC operation; TiOx; cross-point array; nonlinear ReRAM; oxygen profile control; readout margin; reset mode; resistive switching random access memory; selector-less ReRAM; set mode; switching reliability; triangular AC pulse shapes; tunnel barrier characteristics; Annealing; Arrays; Hafnium compounds; Photonic band gap; Reliability; Shape; Switches;
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.2013.6724603