Title :
Adaptive bias simulated evolution algorithm for placement
Author :
Youssef, Habib ; Sait, Sadiq M. ; Ali, Hussain
Author_Institution :
Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Abstract :
Simulated Evolution (SE) is a general meta-heuristic for combinatorial optimization problems. A new solution is evolved from current solution by relocating some of the solution elements. Elements with lower goodnesses have higher probabilities of getting selected for perturbation. Because it is not possible to accurately estimate the goodness of individual elements, SE resorts to a Selection Bias parameter. This parameter has major impact on the algorithm run-time and the quality of the solution subspace searched. In this work, we propose an adaptive bias scheme which adjusts automatically to the quality of solution and makes the algorithm independent of the problem class or instance, as well as any user defined value. Experimental results on benchmark tests show major speedup while maintaining similar solution quality
Keywords :
VLSI; circuit layout CAD; evolutionary computation; integrated circuit layout; logic CAD; perturbation techniques; IC layout; VLSI; adaptive bias scheme; algorithm run-time; combinatorial optimization problems; meta-heuristic; perturbation; placement; selection bias parameter; simulated evolution algorithm; solution quality; solution subspace; user defined value; Benchmark testing; Computational modeling; Computer simulation; Cost function; Minerals; Petroleum; Runtime; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922058