• DocumentCode
    3087130
  • Title

    Silver alloy wire for IC packaging solution

  • Author

    Tan Boo Wei ; Niu You Hua ; Wu Kang Sheng

  • Author_Institution
    R&D Dept., Carsem Semicond., Suzhou, China
  • fYear
    2015
  • fDate
    15-16 March 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In recent years, copper wire has been widely proliferated into mass production. However, the hardness of copper wire requires higher ultrasonic power and bonding force, which lead to higher risk of bond pad crack, in order to avoid bond pad crack without re-engineering the bond pad, silver alloy wire is proposed as an alternative to cu wire bonding due to its softer material property. In this paper, the authors researched into process development of silver alloy wire, including fine tuning of material properties, wire bond and assembly process optimization, and reliability assessment.
  • Keywords
    integrated circuit packaging; integrated circuit reliability; lead bonding; optimisation; silver alloys; Cu; Cu wire bonding; IC packaging solution; assembly process optimization; bonding force; copper wire hardness; fine tuning; material properties; reliability assessment; silver alloy wire; ultrasonic power; Lead; Optimization; Performance evaluation; Silver; Standards; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Technology International Conference (CSTIC), 2015 China
  • Conference_Location
    Shanghai
  • ISSN
    2158-2297
  • Type

    conf

  • DOI
    10.1109/CSTIC.2015.7153438
  • Filename
    7153438