DocumentCode
3087130
Title
Silver alloy wire for IC packaging solution
Author
Tan Boo Wei ; Niu You Hua ; Wu Kang Sheng
Author_Institution
R&D Dept., Carsem Semicond., Suzhou, China
fYear
2015
fDate
15-16 March 2015
Firstpage
1
Lastpage
3
Abstract
In recent years, copper wire has been widely proliferated into mass production. However, the hardness of copper wire requires higher ultrasonic power and bonding force, which lead to higher risk of bond pad crack, in order to avoid bond pad crack without re-engineering the bond pad, silver alloy wire is proposed as an alternative to cu wire bonding due to its softer material property. In this paper, the authors researched into process development of silver alloy wire, including fine tuning of material properties, wire bond and assembly process optimization, and reliability assessment.
Keywords
integrated circuit packaging; integrated circuit reliability; lead bonding; optimisation; silver alloys; Cu; Cu wire bonding; IC packaging solution; assembly process optimization; bonding force; copper wire hardness; fine tuning; material properties; reliability assessment; silver alloy wire; ultrasonic power; Lead; Optimization; Performance evaluation; Silver; Standards; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location
Shanghai
ISSN
2158-2297
Type
conf
DOI
10.1109/CSTIC.2015.7153438
Filename
7153438
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