• DocumentCode
    3087481
  • Title

    Substantiation of aging characteristics of PCM timing detect and turning circuit for 20 years

  • Author

    Saita, Mitsugi ; Ono, Katsumasa ; Shozi, Toshiaki

  • Author_Institution
    Hitachi Ltd., Yokohama, Japan
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    200
  • Lastpage
    207
  • Abstract
    The authors began to develop a tuning circuit in 1963. It consisted of an inductor, a fixed capacitor, and a variable capacitor connected in parallel. The inductor is a Ni-Zn ferrite pot-core coil; the fixed capacitor is a metal-cased MgTiO3 ceramic capacitor; and the variable capacitor is a glass capacitor. The specimen was left at ordinary temperature for 20 years from 1966 in order to measure its aging characteristics. The 20-year changes in the resonant frequency of the circuit, the inductance and the capacitance under ordinary temperature have proved to be approximately linear with respect to the logarithm of time without any exceptions. The design and results coincided well in the changes of their mean values and dispersions. This means that the initial design concept was correct. Since the constants inherent to the inductor and capacitor change linearly with the logarithm of time, their values after long-term aging can be predicted from short-term measurement data. The acceleration coefficient for predicting the characteristics after 20-year aging is as follows: 106 (20 years/10 min.) for the inductor and 700 (20 years/10 days) for the capacitor
  • Keywords
    ageing; capacitors; coils; detector circuits; life testing; pulse-code modulation; timing circuits; tuning; 20 yr; MgTiO3; Ni1-xZnxFe2O4; PCM timing detect; acceleration coefficient; aging characteristics; capacitance; ceramic capacitor; fixed capacitor; glass capacitor; inductance; inductor; long-term aging; pot-core coil; resonant frequency; turning circuit; variable capacitor; Aging; Capacitors; Ceramics; Circuit optimization; Coils; Ferrites; Inductors; Phase change materials; Temperature; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204207
  • Filename
    204207