DocumentCode :
3087553
Title :
Silver-induced volatile species generation from conductive die attach adhesives
Author :
Phillips, T.E. ; deHaas, N. ; Goodwin, P.G. ; Benson, R.C.
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
225
Lastpage :
233
Abstract :
Commercial and model epoxy die-attach adhesives with and without silver filler, were investigated to examine the effect that the silver filler has on the outgassing characteristics of the organic matrix. The materials were subjected to typical temperature processing schedules including cure, preseal bake, and burn-in. The volatile species outgassing during each of the processing periods were analyzed by gas chromatography/mass spectrometry (GC/MS). Thermogravimetric analyses were also performed. It was determined that silver in the adhesive leads to a greater mass loss and a marked change in the outgassing species relative to the same adhesive system without silver. These effects were observed during cure, preseal bake, and burn-in, GC/MS measurements clearly indicated that new chemical species were outgassed when silver was added to the adhesive, suggesting that chemical reactions were occurring at the silver/organic interface
Keywords :
adhesion; chromatography; filled polymers; packaging; reliability; seals (stoppers); thermal analysis; burn-in; conductive die attach adhesives; cure; epoxy die-attach adhesives; filled polymers; gas chromatography; mass spectrometry; organic matrix; outgassing characteristics; preseal bake; temperature processing; thermogravimetric analysis; Chemical analysis; Coatings; Conductivity; Curing; Epoxy resins; Microassembly; Microelectronics; Polyimides; Polymers; Silver;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204211
Filename :
204211
Link To Document :
بازگشت