Title :
An IEEE 1451 standard transducer interface chip
Author :
Cummins, T. ; Brannick, D. ; Byrne, E. ; O´Mara, B. ; Stapleton, H. ; Cleary, J. ; O´Riordan, J. ; Lynch, D. ; Noonan, L. ; Dempsey, D.
Author_Institution :
Analog Devices Inc., Limerick, Ireland
Abstract :
This IEEE 1451 standard chip integrates the key standard transducer interface module (STIM) elements with 12b 5 /spl mu/s conversion in a single device, enabling single-chip STIM implementation for applications requiring higher accuracy and/or faster conversion time such as battery monitoring, pressure and temperature measurement, gas monitoring and leak detection. The footprint and power of this single-chip implementation enable remote 4-20 mA loop-powered smart-transducer applications and co-mounting of the STIM and sensor. A low-complexity split-gate EEPROM cell and metal-poly capacitors with a calibration algorithm in the ADC are key elements in achieving this level of integration. A technique used in the DAC achieves 12b DNL in a small area, allowing integration of two DACs, eliminating the need to use valuable timer/counters for more traditional pulse-width-modulated (PWM) analog outputs.
Keywords :
transducers; 12 bit; 4 to 20 mA; 5 mus; ADC; DAC; IEEE 1451 standard transducer interface chip; STIM; calibration algorithm; metal-poly capacitor; sensor; smart transducer; split-gate EEPROM cell; Batteries; EPROM; Leak detection; Measurement standards; Pulse width modulation; Remote monitoring; Split gate flash memory cells; Temperature measurement; Temperature sensors; Transducers;
Conference_Titel :
Solid-State Circuits Conference, 1998. Digest of Technical Papers. 1998 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-4344-1
DOI :
10.1109/ISSCC.1998.672463