Title :
A CAD tool for benchmarking MOSFET models
Author :
Nastos, N. ; Papananos, Y.
Author_Institution :
Microelectron. Circuit Design Group, Nat. Tech. Univ. of Athens
Abstract :
A fully automated software tool for benchmarking MOSFET models is presented in this paper. The tool is built to run under the Cadence(R) environment and allows the IC designer to easily check the validity of existing models and be informed for the regions of operation where problems are encountered
Keywords :
MOSFET; electronic design automation; semiconductor device models; CAD tool; Cadence environment; IC design; MOSFET models; fully automated software tool; model benchmarking; Analog integrated circuits; Automatic testing; Benchmark testing; Circuit testing; Design automation; Integrated circuit modeling; MOSFET circuits; Radiofrequency integrated circuits; Semiconductor device modeling; Software tools;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922088
