DocumentCode :
3087642
Title :
Multichip module connector evaluation at Unisys
Author :
Kuntz, R.J.
Author_Institution :
Unisys Corp., Rancho Bernardo, CA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
252
Lastpage :
257
Abstract :
Unisys Corporation has been pursuing a course towards high pin count multichip modules (MCMs) for several years. The module development program includes an effort to evaluate and test the connectors required to interconnect these modules. Central to this effort is the Z-AXIS Interconnect Program, which concentrates on the pinless (or pad array) connectors. The studies and testing so far indicate that a Z-AXIS connector like the Fuzz Button is a viable approach for a pad array interconnection of an MCM. The flatness and structural requirements have been studied and determined to be manageable. Testing of buttons has demonstrated that initially buttons can be made to work. Related experience with button connections has been good
Keywords :
electric connectors; multichip modules; Fuzz Button; Unisys; Z-AXIS Interconnect Program; button connections; connectors; high pin count multichip modules; pad array; pinless connectors; structural requirements; Connectors; Contacts; Gold; LAN interconnection; Multichip modules; Nickel; Packaging; Pins; Process design; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204215
Filename :
204215
Link To Document :
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