• DocumentCode
    3087985
  • Title

    Au-Sn bonding metallurgy of TAB contacts and its influence on the Kirkendall effect in the ternary Cu-Au-Sn system

  • Author

    Zakel, Elke ; Reichl, Herbert

  • Author_Institution
    Technol. der Mikroperipherik, Tech. Univ. Berlin, Germany
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    360
  • Lastpage
    371
  • Abstract
    The authors summarize work done on different Au-Sn-Cu and Au-Cu metallurgies in the inner lead bond (ILB) area. The influence of Kirkendall-pore formation in the Cu-Au-Sn system as a degradation mechanism is shown. This effect together with the formation of a new type of ternary intermetallic compound is observed during thermal aging in contacts with a direct interface between the eutectic 80/20 Au-Sn alloy and copper. The zeta-phase (Au/Sn 90/10) acts like a diffusion barrier, which inhibits the pore formation associated with copper diffusion. The composition of the ternary intermetallic compounds, their growth constant, and their activation energy were determined. The possibility of increasing the contact reliability by producing a reliable Au-Sn metallurgy during the ILB-process is shown
  • Keywords
    ageing; chemical interdiffusion; gold; reliability; tape automated bonding; tin; Au-Cu; Au-Sn bonding metallurgy; AuSnCu; Cu diffusion; Kirkendall effect; Kirkendall-pore formation; TAB contacts; contact reliability; degradation mechanism; diffusion barrier; inner lead bond; ternary intermetallic compound; thermal aging; zeta-phase; Aging; Bonding processes; Copper alloys; Gold; Grain boundaries; Intermetallic; Lead; Soldering; Temperature distribution; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204233
  • Filename
    204233