DocumentCode
3087985
Title
Au-Sn bonding metallurgy of TAB contacts and its influence on the Kirkendall effect in the ternary Cu-Au-Sn system
Author
Zakel, Elke ; Reichl, Herbert
Author_Institution
Technol. der Mikroperipherik, Tech. Univ. Berlin, Germany
fYear
1992
fDate
18-20 May 1992
Firstpage
360
Lastpage
371
Abstract
The authors summarize work done on different Au-Sn-Cu and Au-Cu metallurgies in the inner lead bond (ILB) area. The influence of Kirkendall-pore formation in the Cu-Au-Sn system as a degradation mechanism is shown. This effect together with the formation of a new type of ternary intermetallic compound is observed during thermal aging in contacts with a direct interface between the eutectic 80/20 Au-Sn alloy and copper. The zeta-phase (Au/Sn 90/10) acts like a diffusion barrier, which inhibits the pore formation associated with copper diffusion. The composition of the ternary intermetallic compounds, their growth constant, and their activation energy were determined. The possibility of increasing the contact reliability by producing a reliable Au-Sn metallurgy during the ILB-process is shown
Keywords
ageing; chemical interdiffusion; gold; reliability; tape automated bonding; tin; Au-Cu; Au-Sn bonding metallurgy; AuSnCu; Cu diffusion; Kirkendall effect; Kirkendall-pore formation; TAB contacts; contact reliability; degradation mechanism; diffusion barrier; inner lead bond; ternary intermetallic compound; thermal aging; zeta-phase; Aging; Bonding processes; Copper alloys; Gold; Grain boundaries; Intermetallic; Lead; Soldering; Temperature distribution; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0167-6
Type
conf
DOI
10.1109/ECTC.1992.204233
Filename
204233
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