• DocumentCode
    3088203
  • Title

    Thin QFP design and development

  • Author

    Woosley, A. ; Djennas, F. ; McShane, M. ; Primeaux, F. ; Kraft, D. ; Reinhardt, R. ; Bigler, J. ; Casto, J.

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    429
  • Lastpage
    437
  • Abstract
    The challenges presented by the low profile thin quad flat packages (TQFPs) are the design of the mold, control of the assembly operations of wire bonding and molding, moisture performance characteristics, and thermal and mechanical performance. The authors describe the design, modeling for manufacturability, and characterization of a TQFP. The design issues of the TQFP include package symmetry, die thickness, and wire bond loop height. Thermal, mechanical, and electrical modeling results are presented. The assembly process characterization and material selection are discussed. The package performance testing includes moisture weight gain studies, moist package cracking (popcorn) and delamination evaluation, temperature cycle, thermal shock, and autoclave. It is apparent from the moisture preconditioning data that care must be taken to keep the packages in a humidity-controlled environment. A preconditioning bake of 125°C for 8 h hours should be mandatory if packages are exposed to a high humidity environment for a long time period. However, it is clear that when preconditioned appropriately, the TQFP package should have a reliability performance comparable to that of a standard QFP package
  • Keywords
    environmental testing; integrated circuit technology; packaging; QFP design; assembly process characterization; autoclave; delamination evaluation; die thickness; humidity-controlled environment; low profile; material selection; modeling; moist package cracking; moisture performance characteristics; moisture weight gain studies; molding; package performance testing; package symmetry; popcorn; preconditioning bake; reliability performance; temperature cycle; thermal shock; thin quad flat packages; wire bond loop height; Assembly; Bonding; Delamination; Electronics packaging; Moisture control; Performance gain; Temperature; Testing; Virtual manufacturing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204243
  • Filename
    204243