DocumentCode
3088318
Title
An overview of elastomeric conductive polymer interconnection materials and their use in MCM technology
Author
Fulton, J.A. ; Chang, D.D. ; Nis, J.R. ; Schmidt, M.B.
Author_Institution
AT&T Bell Labs., Princeton, NJ, USA
fYear
1992
fDate
18-20 May 1992
Firstpage
473
Lastpage
480
Abstract
A family of anisotropically conducting metal-filled polymer composites that are representative of ACPF (anisotropically conducting polymer film) has been developed. These composites are collectively referred to as elastomeric conductive polymer interconnection (ECPI) materials. The ECPI materials are metal-polymer composites with conduction isolated to the thin (or Z ) direction, as are all ACPF materials. These materials offer unique advantages over more conventional technologies used for module attachment, high density connectors, socketing, and device testing. ECPI materials are well suited to interconnecting pad-grid arrays and, because of their electrical properties and mechanical compliance, they can accommodate short-range surface variations of several mils and transmit high-frequency signals without distortion, and their through-contact resistance is low. In general, ECPI needs only the application of pressure to give interconnection, but a group of design criteria was developed to assure optimal performance. The ECPI structure is discussed, the electrical and mechanical properties of typical ECPI interconnections are described, and design guidelines for using ECPI in connector and testing applications are summarized
Keywords
conducting polymers; elastomers; electric connectors; filled polymers; multichip modules; packaging; ECPI materials; MCM technology; design criteria; elastomeric conductive polymer; electrical properties; high density connectors; high-frequency signals; interconnection materials; mechanical compliance; metal-filled polymer composites; module attachment; pad-grid arrays; testing applications; Anisotropic magnetoresistance; Composite materials; Conducting materials; Connectors; Inorganic materials; Isolation technology; Materials testing; Mechanical factors; Polymer films; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0167-6
Type
conf
DOI
10.1109/ECTC.1992.204248
Filename
204248
Link To Document