DocumentCode :
3088318
Title :
An overview of elastomeric conductive polymer interconnection materials and their use in MCM technology
Author :
Fulton, J.A. ; Chang, D.D. ; Nis, J.R. ; Schmidt, M.B.
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
473
Lastpage :
480
Abstract :
A family of anisotropically conducting metal-filled polymer composites that are representative of ACPF (anisotropically conducting polymer film) has been developed. These composites are collectively referred to as elastomeric conductive polymer interconnection (ECPI) materials. The ECPI materials are metal-polymer composites with conduction isolated to the thin (or Z) direction, as are all ACPF materials. These materials offer unique advantages over more conventional technologies used for module attachment, high density connectors, socketing, and device testing. ECPI materials are well suited to interconnecting pad-grid arrays and, because of their electrical properties and mechanical compliance, they can accommodate short-range surface variations of several mils and transmit high-frequency signals without distortion, and their through-contact resistance is low. In general, ECPI needs only the application of pressure to give interconnection, but a group of design criteria was developed to assure optimal performance. The ECPI structure is discussed, the electrical and mechanical properties of typical ECPI interconnections are described, and design guidelines for using ECPI in connector and testing applications are summarized
Keywords :
conducting polymers; elastomers; electric connectors; filled polymers; multichip modules; packaging; ECPI materials; MCM technology; design criteria; elastomeric conductive polymer; electrical properties; high density connectors; high-frequency signals; interconnection materials; mechanical compliance; metal-filled polymer composites; module attachment; pad-grid arrays; testing applications; Anisotropic magnetoresistance; Composite materials; Conducting materials; Connectors; Inorganic materials; Isolation technology; Materials testing; Mechanical factors; Polymer films; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204248
Filename :
204248
Link To Document :
بازگشت