Title :
Design and optimization methodology for 3D RRAM arrays
Author :
Yexin Deng ; Hong-Yu Chen ; Bin Gao ; Shimeng Yu ; Shih-Chieh Wu ; Liang Zhao ; Bing Chen ; Zizhen Jiang ; Xiaoyan Liu ; Tuo-Hung Hou ; Nishi, Yoshio ; Jinfeng Kang ; Wong, H.-S Philip
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Abstract :
3D RRAM arrays are studied at the device- and architecture-levels. The memory cell performance for a horizontal cross-point is shown experimentally to be essentially comparable to vertical pillar-around geometry. Array performances (read/write, energy, and speed) of different 3D architectures are investigated by SPICE simulation, showing horizontal stacked RRAM is superior but suffers from higher bit cost. Adopting a bi-layer pillar electrode structure is demonstrated to enlarge the array size in 3D vertical RRAM. Design guidelines are proposed for the 3D VRRAM: it shows that increasing the number of stacks of VRRAM while keeping the total bits the same, as well as scaling of feature size (F), are critical for reducing RC delay and energy consumption.
Keywords :
SPICE; circuit optimisation; random-access storage; 3D RRAM arrays; 3D vertical RRAM; SPICE simulation; bilayer pillar electrode structure; horizontal cross-point; horizontal stacked RRAM; memory cell performance; optimization methodology; resistive RAM; vertical pillar-around geometry; Computer architecture; Delays; Energy consumption; Microprocessors; Resistance; Three-dimensional displays; Tin;
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.2013.6724693