DocumentCode
3088934
Title
Third IEEE International Workshop on Electronic Design, Test and Applications
fYear
2006
fDate
17-19 Jan. 2006
Abstract
The following topics are dealt with: fault diagnosis; analog components; integrated circuit design; image and video processing; integrated circuit testing; electronics education; logic design and optimization; electromagnetic sensors and devices; fault modeling; microprocessors; microphotonics; built in self test; fault tolerance; signal processing; design verification and concurrent checking
Keywords
built-in self test; concurrent engineering; electromagnetic devices; electronic engineering education; fault diagnosis; image processing; integrated circuit design; integrated circuit testing; logic design; microprocessor chips; sensors; signal processing; video signal processing; analog components; built in self test; concurrent checking; design verification; electromagnetic sensors; electronics education; fault diagnosis; fault modeling; fault tolerance; image processing; integrated circuit design; integrated circuit testing; logic design; microphotonics; microprocessors; signal processing; video processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Conference_Location
Kuala Lumpur
Print_ISBN
0-7695-2500-8
Type
conf
DOI
10.1109/DELTA.2006.89
Filename
1581171
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