Title :
Some common aspects of design validation, debug and diagnosis
Author :
Arnaout, Talal ; Bartsch, Günter ; Wunderlich, Hans-Joachim
Author_Institution :
Inst. fur Technische Informatik, Univ. Stuttgart
Abstract :
Design, verification and test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In this paper, an overview is given on the common aspects of these tasks and how they interact. Diagnosis techniques may be used after manufacturing, for chip characterization and field return analysis, and even for rapid prototyping
Keywords :
fault diagnosis; integrated circuit design; integrated circuit manufacture; integrated circuit testing; chip characterization; diagnostic resolution; field return analysis; integrated circuit design; integrated circuit test; integrated circuit verification; rapid prototyping; test application time; test speed; test volume; Circuit faults; Circuit testing; Electrical fault detection; Emulation; Fault detection; Integrated circuit testing; Manufacturing; Performance evaluation; Prototypes; System testing;
Conference_Titel :
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7695-2500-8
DOI :
10.1109/DELTA.2006.79
