DocumentCode :
3089134
Title :
High performance gallium-zinc oxynitride thin film transistors for next-generation display applications
Author :
Tae Sang Kim ; Hyun-Suk Kim ; Joon Seok Park ; Kyoung Seok Son ; Eok Su Kim ; Jong-Baek Seon ; Sunhee Lee ; Seok-Jun Seo ; Sun-Jae Kim ; Sungwoo Jun ; Kyung Min Lee ; Dong Jae Shin ; Jaewook Lee ; Chunhyung Jo ; Sung-Jin Choi ; Dong Myong Kim ; Dae Hwan K
fYear :
2013
fDate :
9-11 Dec. 2013
Abstract :
High speed thin film transistors (TFTs) are in great need for next-generation TVs which will employ ultra high definition resolution (3840×2160) panels and possibly include multi-view autostereoscopic 3D technology which will negate the use of glasses for 3D viewing mode. In order to achieve high mobility devices, various types of metal oxide semiconductors have been extensively studied, including the most popular In-Ga-Zn-O, with typical field effect mobilities ranging between 10 to 30 cm2/Vs. Although these numbers are much higher than that of conventional amorphous silicon (0.5~1.0 cm2/Vs) TFTs, there is a strong demand for even higher mobility semiconductors which can exhibit excellent uniformity over a large area.
Keywords :
amorphous semiconductors; gallium compounds; high definition television; indium compounds; thin film transistors; 3D viewing mode; InGaZnO; TFT; amorphous silicon; field effect mobility; gallium-zinc oxynitride; high speed thin film transistors; metal oxide semiconductors; multiview autostereoscopic 3D technology; next-generation TV; next-generation display applications; ultra high definition resolution; Doping; Films; Hall effect; Mathematical model; Nitrogen; Thin film transistors; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEDM.2013.6724701
Filename :
6724701
Link To Document :
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