• DocumentCode
    3089464
  • Title

    Wire bond development for high-pincount surface-mount

  • Author

    Shu, Bill

  • Author_Institution
    VLSI Technology Inc., San Jose, CA, USA
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    890
  • Lastpage
    898
  • Abstract
    The continuous miniaturization of computers necessitates the use of new high pin count plastic packages such as TQFP (thin quad flat pack). These new package types, with 1.4-, 1.0-, or 0.8-mm plastic package body thickness, have very limited space for bond wire, specifically in the loop height dimension. This restriction imposes a challenge to the traditional wire bond technology, especially when long wire is needed for small die. The author reviews the constraints a thin plastic package imposes on wire bonding, and presents a statistical design of an experiment based on a response surface methodology to characterize wire loop profile control. Based on the regression equations generated, a mathematical model is established to guide the development of a predetermined loop profile suitable for thin plastic package assembly. The effects of major bonding parameters, such as wire length, kink-height, reverse loop, loop factor, bonding speeds, and wire tension, and their interactions on loop profile are analyzed
  • Keywords
    lead bonding; surface mount technology; SMD; SMT; TQFP; bond wire; bonding parameters; bonding speeds; high-pincount; kink-height; loop factor; mathematical model; microassembly; package assembly; plastic packages; regression equations; response surface methodology; reverse loop; statistical design; surface-mount; thin quad flat pack; wire bond technology; wire length; wire loop profile control; wire tension; Assembly; Bonding; Electronics packaging; Microassembly; Microcomputers; Plastic packaging; Response surface methodology; Semiconductor device packaging; Space technology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204312
  • Filename
    204312