• DocumentCode
    3089610
  • Title

    Comprehensive methodology for the design and assessment of crossbar memory array with nonlinear and asymmetric selector devices

  • Author

    An Chen

  • Author_Institution
    TD Res., GLOBALFOUNDRIES, Sunnyvale, CA, USA
  • fYear
    2013
  • fDate
    9-11 Dec. 2013
  • Abstract
    Technology and design tradeoffs are important for crossbar memory array optimization. A comprehensive model is presented in this paper to assess array functionality with different nonlinear and asymmetric selector parameters, bias schemes, and array designs. Array Vdd should be maximized within power and efficiency constraints. Partial bias schemes can be chosen based on selector types and design targets. Different dependence of array selectivity and power efficiency on selector parameters presents technology tradeoffs. Impact of line resistance, contact resistance, and memory variability is analyzed. Parallel access and self-selecting design may improve array performance.
  • Keywords
    random-access storage; semiconductor device models; array designs; array functionality; array selectivity; asymmetric selector parameters; contact resistance; crossbar memory array optimization; design targets; line resistance; memory variability; nonlinear selector parameters; parallel access; partial bias schemes; power efficiency; selector types; self-selecting design; Arrays; Junctions; Power demand; Resistance; Sensors; Switches; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2013 IEEE International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IEDM.2013.6724723
  • Filename
    6724723