• DocumentCode
    3089630
  • Title

    Calibration of AFM based nanomanipulation system

  • Author

    Li, Guangyong ; Xi, Ning ; Yu, Mengrneng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    26 April-1 May 2004
  • Firstpage
    422
  • Abstract
    Using AFM as a nanomanipulation tool has been discussed for more than a decade. However, its lack of real-time visual feedback during manipulation has hindered its wide application. Fortunately, this problem has been overcome by our recently developed augmented reality system. Not only can this new system provide real-time force feedback but real-time visual feedback during nanomanipulation. In order to build this augmented reality system, a lot of parameters are used to model the force interaction, measure the forces, and control the tip motion. In this paper, calibration of all parameters used in the augmented reality system is discussed in details.
  • Keywords
    atomic force microscopy; augmented reality; calibration; force feedback; micromanipulators; nanotechnology; real-time systems; atomic force microscopy; augmented reality system; nanomanipulation system calibration; real-time force feedback; real-time visual feedback; Atomic force microscopy; Augmented reality; Calibration; Displays; Force feedback; Force measurement; Haptic interfaces; Motion measurement; Optical microscopy; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 2004. Proceedings. ICRA '04. 2004 IEEE International Conference on
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-8232-3
  • Type

    conf

  • DOI
    10.1109/ROBOT.2004.1307186
  • Filename
    1307186