DocumentCode
3089630
Title
Calibration of AFM based nanomanipulation system
Author
Li, Guangyong ; Xi, Ning ; Yu, Mengrneng
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
1
fYear
2004
fDate
26 April-1 May 2004
Firstpage
422
Abstract
Using AFM as a nanomanipulation tool has been discussed for more than a decade. However, its lack of real-time visual feedback during manipulation has hindered its wide application. Fortunately, this problem has been overcome by our recently developed augmented reality system. Not only can this new system provide real-time force feedback but real-time visual feedback during nanomanipulation. In order to build this augmented reality system, a lot of parameters are used to model the force interaction, measure the forces, and control the tip motion. In this paper, calibration of all parameters used in the augmented reality system is discussed in details.
Keywords
atomic force microscopy; augmented reality; calibration; force feedback; micromanipulators; nanotechnology; real-time systems; atomic force microscopy; augmented reality system; nanomanipulation system calibration; real-time force feedback; real-time visual feedback; Atomic force microscopy; Augmented reality; Calibration; Displays; Force feedback; Force measurement; Haptic interfaces; Motion measurement; Optical microscopy; Real time systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation, 2004. Proceedings. ICRA '04. 2004 IEEE International Conference on
ISSN
1050-4729
Print_ISBN
0-7803-8232-3
Type
conf
DOI
10.1109/ROBOT.2004.1307186
Filename
1307186
Link To Document