Title :
A thin film multichip module for workstation applications
Author :
Bregman, Mark F. ; Kimura, A. ; Matsui, T. ; Nishida, H. ; Nishiyama, K. ; Ohkuma, Hideo ; Tanaka, A. ; Kovac, C. ; McQueeney, D.
Author_Institution :
IBM Japan Ltd., Shiga, Japan
Abstract :
A thin film multichip module which utilizes very high density wiring on a silicon substrate has been developed. The technology has been demonstrated using the IBM RISC (reduced instruction set computer) System/6000 processor as a vehicle. The prototype module contains a RISC processor consisting of nine CMOS VLSI chips. The package also contains decoupling capacitors and has 684 I/O. The substrate consists of a thin film structure fabricated on a silicon wafer using a polyimide dielectric and aluminum metal. All fabrication was done in an existing CMOS manufacturing line. IBM´s C4 (controlled collapse chip connection) flip chip bonding technique was used to connect the CMOS VLSI chips to the package. The silicon substrate was packaged nonhermetically and connected to the next level of packaging using very high density surface mount flex cables. A clip-on heatsink was attached to the finished module, which allows for up to 30 W of power dissipation in the air flow found in a typical workstation environment
Keywords :
flip-chip devices; hybrid integrated circuits; multichip modules; reduced instruction set computing; thin film circuits; workstations; 30 W; Al metallisation; CMOS VLSI chips; IBM RISC system/6000; RISC processor; Si substrate; clip-on heatsink; controlled collapse chip connection; decoupling capacitors; flip chip bonding; polyimide dielectric; reduced instruction set computer; surface mount flex cables; thin film multichip module; workstation applications; Dielectric substrates; Dielectric thin films; Multichip modules; Packaging; Reduced instruction set computing; Semiconductor thin films; Silicon; Transistors; Very large scale integration; Workstations;
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
DOI :
10.1109/ECTC.1992.204322