• DocumentCode
    3089722
  • Title

    Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications

  • Author

    Kerkhoff, Hans G. ; Huijts, Jarkko J M

  • Author_Institution
    Centre of Telecommun. & Inf. Technol. (CTIT), Enschede
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    38
  • Lastpage
    44
  • Abstract
    The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reconfigurable multi-processor-cores SoCs. These processing cores within the SoC can be subsequently connected with each other by a communication-centric NoC, thereby reducing data-traffic problems. The (repetitive) multi-processor-cores feature inside these SoCs, the programmable routing via NoC, as well as the repetitive hardware in the cores themselves provides new opportunities for efficient testing at different hierarchical levels. These opportunities, and the inserted DfT, test vectors and coverage can be subsequently applied for enhancing the dependability of SoCs as well as these cores via self-repair. As examples of new opportunities we introduce the feedback loop and KGC concept for enhancing diagnosis and reducing external communication respectively. The self-repair can be done either by rerouting of unused resources or software remapping of correct resources to an application.
  • Keywords
    CMOS integrated circuits; data communication; design for testability; integrated circuit testing; logic testing; network routing; network-on-chip; system-on-chip; ASIC design; CMOS technology; DfT; KGC concept; SoC; communication-centric NoC; data streaming applications; data-traffic problems; feedback loop; highly reconfigurable processor core; multiprocessor-cores; programmable routing; software remapping; Application software; Automatic testing; CMOS technology; Electronic equipment testing; Hardware; Information technology; Network-on-a-chip; Routing; System testing; Tiles; ATPG; Design-for-Test; dependable SoCs; embedded system test; reconfigurable multi-processor-cores SoC; self-repair;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.34
  • Filename
    4459506