DocumentCode
3089722
Title
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications
Author
Kerkhoff, Hans G. ; Huijts, Jarkko J M
Author_Institution
Centre of Telecommun. & Inf. Technol. (CTIT), Enschede
fYear
2008
fDate
23-25 Jan. 2008
Firstpage
38
Lastpage
44
Abstract
The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reconfigurable multi-processor-cores SoCs. These processing cores within the SoC can be subsequently connected with each other by a communication-centric NoC, thereby reducing data-traffic problems. The (repetitive) multi-processor-cores feature inside these SoCs, the programmable routing via NoC, as well as the repetitive hardware in the cores themselves provides new opportunities for efficient testing at different hierarchical levels. These opportunities, and the inserted DfT, test vectors and coverage can be subsequently applied for enhancing the dependability of SoCs as well as these cores via self-repair. As examples of new opportunities we introduce the feedback loop and KGC concept for enhancing diagnosis and reducing external communication respectively. The self-repair can be done either by rerouting of unused resources or software remapping of correct resources to an application.
Keywords
CMOS integrated circuits; data communication; design for testability; integrated circuit testing; logic testing; network routing; network-on-chip; system-on-chip; ASIC design; CMOS technology; DfT; KGC concept; SoC; communication-centric NoC; data streaming applications; data-traffic problems; feedback loop; highly reconfigurable processor core; multiprocessor-cores; programmable routing; software remapping; Application software; Automatic testing; CMOS technology; Electronic equipment testing; Hardware; Information technology; Network-on-a-chip; Routing; System testing; Tiles; ATPG; Design-for-Test; dependable SoCs; embedded system test; reconfigurable multi-processor-cores SoC; self-repair;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location
Hong Kong
Print_ISBN
978-0-7695-3110-6
Type
conf
DOI
10.1109/DELTA.2008.34
Filename
4459506
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