• DocumentCode
    3089901
  • Title

    Quartz crystal resonator model measurement and sensitivity analysis

  • Author

    Park, Karen ; Malocha, Donald ; Belkerdid, Madjid

  • Author_Institution
    Dept. of Electr. Eng. & Commun. Sci., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    1989
  • fDate
    31 May-2 Jun 1989
  • Firstpage
    372
  • Lastpage
    376
  • Abstract
    A quartz crystal resonator that can be modeled as a one- or two-port electrical circuit is discussed. Extraction of the equivalent electrical parameters can be accomplished using scattering parameters measured near the resonant frequency of the crystal. Due to measurement errors inherent in the network analyzer, the extracted parameters will vary from run to run. These measurement inaccuracies lead to greater errors in the electrical parameters as the magnitude of S11 (one-port model) or S12 (two-port model) approaches one. This work presents results of measured and simulated data and a first-order sensitivity theory. An expression for the error in the extracted series resistance is derived. Simulated and actual crystal data are compared to the theoretical values for the one-port model
  • Keywords
    S-parameters; crystal resonators; equivalent circuits; network analysers; quartz; sensitivity analysis; crystal resonator model; equivalent electrical parameters; measurement errors; network analyzer; one-port model; quartz; resonant frequency; scattering parameters; sensitivity analysis; series resistance; two-port electrical circuit; Circuits; Data mining; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Measurement errors; Resonant frequency; Scattering parameters; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/FREQ.1989.68892
  • Filename
    68892