DocumentCode
3090058
Title
Built-In Self-Test for Embedded Voltage Regulator
Author
Shi, Jiang ; Smith, Ricky
Author_Institution
Texas Instrum., Dallas
fYear
2008
fDate
23-25 Jan. 2008
Firstpage
133
Lastpage
136
Abstract
The embedded voltage regulator design supports the single-chip CMOS integration market strategy to reduce the overall system cost and improve system performance. Multiply technologies, such as innovative built-in self-test technology and accurate test methodology for embedded voltage regulator are presented that is critical for test accessibility and reliability.
Keywords
CMOS integrated circuits; built-in self test; reliability; voltage regulators; built-in self-test; embedded voltage regulator; single-chip CMOS integration market strategy; voltage output; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Consumer electronics; Electronic equipment testing; Manufacturing; Regulators; System testing; Voltage; built-in; current loading; embedded; manufacturing; regulator; self-test; voltage output;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location
Hong Kong
Print_ISBN
978-0-7695-3110-6
Type
conf
DOI
10.1109/DELTA.2008.41
Filename
4459526
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