Title :
Built-In Self-Test for Embedded Voltage Regulator
Author :
Shi, Jiang ; Smith, Ricky
Author_Institution :
Texas Instrum., Dallas
Abstract :
The embedded voltage regulator design supports the single-chip CMOS integration market strategy to reduce the overall system cost and improve system performance. Multiply technologies, such as innovative built-in self-test technology and accurate test methodology for embedded voltage regulator are presented that is critical for test accessibility and reliability.
Keywords :
CMOS integrated circuits; built-in self test; reliability; voltage regulators; built-in self-test; embedded voltage regulator; single-chip CMOS integration market strategy; voltage output; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Consumer electronics; Electronic equipment testing; Manufacturing; Regulators; System testing; Voltage; built-in; current loading; embedded; manufacturing; regulator; self-test; voltage output;
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
DOI :
10.1109/DELTA.2008.41
