Title :
Amplitudes of transverse waves in the acoustical birefringence in [110] Silicon single crystal
Author :
Hye-Jeong Kim ; Seho Kwon ; Kim, You Ho
Author_Institution :
Appl. Acoust. Lab., Korea Sci. Acad. of KAIST, Busan, South Korea
Abstract :
Wave velocities are dependent on the propagation direction in an anisotropic solid, and transverse waves can propagate with different wave velocities for certain propagation direction. The particle displacements are determined by propagating transverse wave mode. In the present work, the waves velocities and amplitudes of transverse waves were investigated when transverse wave with arbitrary direction of particle displacement propagate in anisotropic solids. Acoustic birefringence of bulk transverse wave propagating in [110] direction through silicon single crystal is studied. There are two transverse wave modes when the wave is applied along [110] direction in single crystal. Transverse wave is generated by using 20 MHz frequency transducer which delay line is 7 μs. For delicate control of vibration axis position, the [110] silicon single crystal is attached to rotary table with angle indicator. By pulse/echo method, the same transducer detects elastic transverse wave which is reflected and turns back from the opposite boundary of the sample.
Keywords :
acoustic wave propagation; birefringence; elastic constants; elastic waves; elemental semiconductors; silicon; ultrasonic propagation; vibrations; Si; [110] silicon single crystal; acoustic birefringence; angle indicator; anisotropic solids; bulk transverse wave propagation; elastic constants; elastic transverse wave; frequency 20 MHz; frequency transducer; particle displacement; pulse-echo method; rotary table; transverse wave amplitude; ultrasonic wave propagation; vibration control axis position; wave velocity; Acoustics; Crystals; Equations; Optical polarization; Silicon; Solids; Time-domain analysis;
Conference_Titel :
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location :
Prague
Print_ISBN :
978-1-4673-5684-8
DOI :
10.1109/ULTSYM.2013.0416