Title :
Automatic March tests generation for multi-port SRAMs
Author :
Benso, A. ; Bosio, A. ; Carlo, S. Di ; Natale, G. Di ; Prinetto, P.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
Testing of Multi-Port (MP) SRAMs requires special tests since the multiple and simultaneous access can sensitize faults that are different from the conventional single-port memory faults. In spite of their growing use, few works have been published on testing MP memories. In addition, most of the published work concentrated only on two ports memories (i.e., 2P memories). This paper presents a methodology to automatically generate march tests for MP memories. It is based on generations of single port memory march test firstly, then extending it to test a generic MP SRAMs. A set of experimental results shows the effectiveness of the proposed solution.
Keywords :
SRAM chips; integrated circuit testing; automatic March tests generation; memory faults; multi port SRAM; Automatic testing; Data buses; Digital systems; Electronic equipment testing; Multiprocessing systems; Page description languages; Random access memory; System testing; Telecommunication control; Writing;
Conference_Titel :
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN :
0-7695-2500-8
DOI :
10.1109/DELTA.2006.17
