DocumentCode
3090333
Title
A simplified gate-level fault model for crosstalk effects analysis
Author
Civera, Pierluigi ; Macchiarulo, Luca ; Violante, Massimo
Author_Institution
Dipt. di Elettronica, Politecnico di Torino, Italy
fYear
2002
fDate
2002
Firstpage
31
Lastpage
39
Abstract
The relevant problem of crosstalk affects the design process in many ways. Its delay effects can not be easily addressed due to the complex interaction between signals and dependency on the logical, functional and timing aspects of the design. In this paper we propose a modelling approach and a methodology to assess crosstalk effects on real designs through a simulation-based analysis environment. Results are reported showing how the proposed approach has been used to validate the bus architecture inside the LEON SPARC-like processor core.
Keywords
VLSI; circuit simulation; crosstalk; hardware description languages; logic CAD; microprocessor chips; timing; LEON SPARC-like processor core; bus architecture; crosstalk effects analysis; deep sub micron technologies; delay effects; design process; gate-level fault model; simulation-based analysis environment; timing; Analytical models; Capacitance; Crosstalk; Delay effects; Delay estimation; Logic; Process design; Signal design; Timing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
ISSN
1550-5774
Print_ISBN
0-7695-1831-1
Type
conf
DOI
10.1109/DFTVS.2002.1173499
Filename
1173499
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