DocumentCode :
3090333
Title :
A simplified gate-level fault model for crosstalk effects analysis
Author :
Civera, Pierluigi ; Macchiarulo, Luca ; Violante, Massimo
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
fYear :
2002
fDate :
2002
Firstpage :
31
Lastpage :
39
Abstract :
The relevant problem of crosstalk affects the design process in many ways. Its delay effects can not be easily addressed due to the complex interaction between signals and dependency on the logical, functional and timing aspects of the design. In this paper we propose a modelling approach and a methodology to assess crosstalk effects on real designs through a simulation-based analysis environment. Results are reported showing how the proposed approach has been used to validate the bus architecture inside the LEON SPARC-like processor core.
Keywords :
VLSI; circuit simulation; crosstalk; hardware description languages; logic CAD; microprocessor chips; timing; LEON SPARC-like processor core; bus architecture; crosstalk effects analysis; deep sub micron technologies; delay effects; design process; gate-level fault model; simulation-based analysis environment; timing; Analytical models; Capacitance; Crosstalk; Delay effects; Delay estimation; Logic; Process design; Signal design; Timing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-1831-1
Type :
conf
DOI :
10.1109/DFTVS.2002.1173499
Filename :
1173499
Link To Document :
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