Title :
Injecting bit flip faults by means of a purely software approach: a case studied
Author :
Velazco, R. ; Corominas, A. ; Ferreyra, P.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
Bit flips provoked by radiation are a main concern for space applications. A fault injection experiment performed using a software simulator is described in this paper. Obtained results allow us to predict a low sensitivity to soft errors for the studied application, putting in evidence critical memory elements.
Keywords :
digital integrated circuits; digital signal processing chips; errors; fault simulation; radiation effects; semiconductor storage; sensitivity analysis; DSP32C digital signal processor; SEU sensitivity evaluation; bit flip faults; fault injection; low error sensitivity; memory elements; microelectronic circuits; radiation environment; soft errors; software simulator; Aerospace electronics; Atmosphere; Circuit faults; Circuit testing; Computer aided software engineering; Neutrons; Silicon; Space charge; Space technology; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
Print_ISBN :
0-7695-1831-1
DOI :
10.1109/DFTVS.2002.1173507
