• DocumentCode
    3090649
  • Title

    A Generation Flow for Self-Reconfiguration Controllers Customization

  • Author

    Cuoccio, Andrea ; Grassi, Paolo R. ; Rana, Vincenzo ; Santambrogio, Marco D. ; Sciuto, Donatella

  • Author_Institution
    Politecnico di Milano, Milan
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    279
  • Lastpage
    284
  • Abstract
    Partial dynamic self-reconfiguration can be obtained, in Xilinx´s Virtex families of FPGAs, through the Internal Con figuration Access Port (ICAP). Reconfiguration time is thus bounded to the ICAP rate. Different techniques have been proposed to speedup the reconfiguration process and one of the most promising one uses a memory to store the bit- stream inside the IP-Core that controls the ICAP port. The size of this memory can be chosen during the implementation phase in order to find a trade off between resource´s requirement and reconfiguration throughput. Moreover, a good level of customization can be achieved by choosing both the bus interface used by the ICAP controller and the implementation type, Slices or BRAMs, of its internal memory. This paper describes a framework used to create the most suitable controller according to the reconfiguration scenario where it will be used. To set all the parameters used to create the controller, a set of metrics, used to describe the reconfiguration scenario, has been defined. These metrics are used in the proposed flow to find the setting of the ICAP controller that best suits the scenario in which it will operate.
  • Keywords
    field programmable gate arrays; reconfigurable architectures; FPGA; Xilinx Virtex family; bus interface; generation flow; internal configuration access port; self-reconfiguration controller customization; Automatic control; Automatic testing; Control systems; Electronic equipment testing; Field programmable gate arrays; Libraries; Memory management; Runtime; System buses; Throughput; Customization; Reconfiguration; Reconfiguration Controller;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.35
  • Filename
    4459557