DocumentCode :
3090719
Title :
High Performance Elliptic Curve Cryptographic Processor Over GF(2^163)
Author :
Choi, Hyun Min ; Hong, Chun Pyo ; Kim, Chang Hoon
Author_Institution :
Daegu Univ., Daegu
fYear :
2008
fDate :
23-25 Jan. 2008
Firstpage :
290
Lastpage :
295
Abstract :
In this paper, we propose a high performance elliptic curve cryptographic processor over GF(2163). The proposed architecture is based on a modified Lopez-Dahab elliptic curve point multiplication algorithm and uses Gaussian normal basis (GNB) for GF(2163) field arithmetic. To achieve a high throughput rates, we design two new word- level arithmetic units over GF(2163) and derive a parallelized elliptic curve point doubling and point addition algorithm. We implement our design using Xilinx XC4VLX80 FPGA device which uses 24,263 slices and has a maximum frequency of 143 MHz. Our design is roughly 4.8 times faster with 2 times increased hardware complexity compared with the previous hardware implementation. Therefore, the proposed architecture is well suited to elliptic curve cryptosystems requiring high throughput rates such as network processors and Web servers.
Keywords :
Galois fields; Gaussian processes; computational complexity; cryptography; digital arithmetic; field programmable gate arrays; logic design; multiplying circuits; ECC processor performance; GF(2163) field arthimetic; Gaussian normal basis; Web servers; Xilinx XC4VLX80 FPGA device; elliptic curve cryptosystems; frequency 143 MHz; hardware complexity; high performance elliptic curve cryptographic processor; modified Lopez-Dahab elliptic curve point multiplication algorithm; network processors; parallelized elliptic curve point doubling; point addition algorithm; word- level arithmetic units; Algorithm design and analysis; Arithmetic; Elliptic curve cryptography; Elliptic curves; Field programmable gate arrays; Frequency; Gaussian processes; Hardware; Service oriented architecture; Throughput; Cryptographic Processor; Elliptic Curve Cryptosystem; Finite Field; Gaussian Normal Basis; VLSI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
Type :
conf
DOI :
10.1109/DELTA.2008.118
Filename :
4459559
Link To Document :
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