DocumentCode
3090753
Title
A memory overhead evaluation of the interleaved signature instruction stream
Author
Rodríguez, F. ; Campelo, J.C. ; Serrano, J.J.
Author_Institution
Dept. de Sistemas Inf. y Comput., Univ. Politecnica de Valencia, Spain
fYear
2002
fDate
2002
Firstpage
225
Lastpage
232
Abstract
Using a watchdog processor for concurrent error detection of a processor execution flow is a well-known technique to increase the dependability of a microprocessor system. Most approaches embed reference signatures for the watchdog processor into the processor instruction stream creating noticeable memory and performance overheads. The interleaved signature instruction stream (ISIS) technique is a signature embedding technique that allows signatures to co-exist with the main instruction stream with a minimal impact on processor performance, without sacrificing error detection coverage or latency. This technique has been implemented into HORUS, a MIPS-like RISC processor developed in VHDL. This paper presents the HORUS architecture novelties demanded by ISIS, discusses the performance impact of adding an ISIS watchdog processor and provides results of ISIS memory overhead. These results are compared against similar solutions previously presented in the literature.
Keywords
error detection; hardware description languages; instruction sets; microprocessor chips; performance evaluation; reduced instruction set computing; HORUS; ISIS; MIPS-like RISC processor; VHDL; concurrent error detection; dependability; error detection coverage; interleaved signature instruction stream; memory overhead evaluation; performance overheads; processor execution flow; processor instruction stream; processor performance; reference signatures; signature embedding technique; watchdog processor; Concurrent computing; Control systems; Cost accounting; Delay; Error correction; Fault detection; Fault tolerant systems; Intersymbol interference; Microprocessors; Reduced instruction set computing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
ISSN
1550-5774
Print_ISBN
0-7695-1831-1
Type
conf
DOI
10.1109/DFTVS.2002.1173519
Filename
1173519
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