Using run-time reconfiguration for fault injection in hardware prototypes

In this paper, a new methodology for the injection of single event upsets (SEU) in memory elements is introduced. SEUs in memory elements can occur due to many reasons (e.g. particle hits, radiation) and at any time. It becomes therefore important to examine the behaviour of circuits when an SEU occurs in them. Reconfigurable hardware (especially FPGAs) was shown to be suitable to emulate the behaviour of a logic design and to realise fault injection. The proposed methodology for SEU injection exploits FPGAs and, contrarily to the most common fault injection techniques, realises the injection directly in the reconfigurable hardware, taking advantage of run-time reconfiguration capabilities of the device. In this case, no modification of the initial design description is needed to inject a fault, that results in avoiding hardware overheads and specific synthesis, place and route phases.