• DocumentCode
    3090821
  • Title

    Availability of HV Circuit-Breakers: The Application of Markov Model

  • Author

    Choonhapran, P. ; Balzer, G.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. Darmstadt, Darmstadt
  • fYear
    2007
  • fDate
    24-28 June 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    High voltage circuit-breakers are one of the most important equipment in power systems. They serve as interrupting devices which interrupt the operating and short-circuit currents. They are subject to many interruptions such as major failures and minor failures during lifetime. In order to study reliability and availability of HV circuit-breakers, these interruptions have been recorded in terms of database. In this study, the interruption database of different types of HV circuit- breakers from 1960s is applied in order to investigate the mean time to failure (MTTF). Afterwards, the Markov model of HV circuit- breakers composed of 5 components in parallel: drive, HV insulation, life-parts, control/auxiliary, and others is applied. The mean time to repair (MTTR) of each component is also taken into account. Finally, the results of Markov process show the reliability and availability of different types of HV circuit-breakers.
  • Keywords
    Markov processes; circuit breakers; maintenance engineering; power system protection; power system reliability; short-circuit currents; HV insulation; Markov model; high-voltage circuit-breaker availability; interruption database; mean time-to-failure; power system apparatus; reliability; short-circuit currents; Availability; Circuits; Databases; Hydraulic drives; Maintenance; Markov processes; Petroleum; Power system modeling; Power system reliability; Sulfur hexafluoride; HV circuit-breakers; Markov process; Mean time to failure (MTTF); Mean time to repair (MTTR); availability; parallel Markov model; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2007. IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    1932-5517
  • Print_ISBN
    1-4244-1296-X
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2007.385673
  • Filename
    4275282