Title :
Sensitivity of Orthogonal Magnetoresistive Heads
Author :
Po-Kang Wang ; Krounbi, M. ; Heim, D. ; Lee, R.
Author_Institution :
IBM Almaden Research
Keywords :
Current density; Degradation; Dynamic range; Magnetic heads; Magnetic sensors; Magnetoresistance; Noise robustness; Sensor phenomena and characterization; Thermal sensors; Thin film sensors;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642140