Title :
Neighbor current ratio (NCR): a new metric for IDDQ data analysis
Author :
Sabade, Sagar S. ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault free currents. The concept of current ratios, in which the ratio of maximum to minimum IDDQ is used to screen faulty chips, has been previously proposed. The neighboring chips on a wafer have similar fault free properties and are correlated. In this paper, the use of spatial correlation in combination with current ratios is investigated. By differentiating chips based on their nonconformance to local IDDQ variation, outliers are identified. The analysis of SEMATECH data is presented.
Keywords :
CMOS digital integrated circuits; VLSI; automatic testing; integrated circuit testing; logic testing; IDDQ data analysis; IDDQ test; SEMATECH data; deep sub-micron chips; fault free properties; neighbor current ratio; nonconformance; outliers; Data analysis; Electrical capacitance tomography; Electrical resistance measurement; Equations; Fault tolerant systems; Leakage current; Semiconductor device measurement; Shape; Testing; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
Print_ISBN :
0-7695-1831-1
DOI :
10.1109/DFTVS.2002.1173535
