Author index

fYear

2002

fDate

6-8 Nov. 2002

Firstpage

437

Lastpage

438

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on

Conference_Location

Vancouver, BC, Canada

ISSN

1550-5774

Print_ISBN

0-7695-1831-1

Type

conf

DOI

10.1109/DFTVS.2002.1173542

Filename

1173542

Link To Document