Title : 
Classification of linear modulations by a combination of different orders cyclic cumulants
         
        
            Author : 
Marchand, Pierre ; Martret, Christophe Le ; Lacoume, Jean-Louis
         
        
            Author_Institution : 
TEAMLOG, Le Grand Sablon, La Tronche, France
         
        
        
        
        
        
            Abstract : 
The search for discriminating features is a crucial point when a modulation classification task is aimed. This paper introduces new features based on a combination of fourth- and second-order temporal cyclic cumulants. Such a combination enhances the theoretical discrimination that can be achieved by a single stationary cumulant, and moreover, the cyclic parameters become discriminating whereas it is not the case when they are considered at pure orders. As an application, we propose a process to classify 4-PSK vs. 16-QAM modulations. The classification is achieved by estimating the feature for the received signal, and comparing it with theoretical ones by a matched filter technique. Simulations show that though the cyclic parameters are a priori more discriminating than their stationary counterparts, the variance of their estimates may overcome this advantage
         
        
            Keywords : 
higher order statistics; parameter estimation; pattern classification; phase shift keying; quadrature amplitude modulation; signal processing; 16-QAM; 4-PSK; cyclic parameters; discriminating features; fourth-order temporal cyclic cumulants; linear modulations; matched filter; modulation classification; received signal; second-order temporal cyclic cumulants; stationary counterpart; variance; Digital modulation; Feature extraction; Information analysis; Matched filters; Parameter estimation; Quadrature phase shift keying; Signal analysis; Signal processing; Statistics;
         
        
        
        
            Conference_Titel : 
Higher-Order Statistics, 1997., Proceedings of the IEEE Signal Processing Workshop on
         
        
            Conference_Location : 
Banff, Alta.
         
        
            Print_ISBN : 
0-8186-8005-9
         
        
        
            DOI : 
10.1109/HOST.1997.613485