DocumentCode
3091568
Title
Temperature dependence of X-ray diffraction on lanthanum-gallium silicate crystal modulated by surface acoustic wave
Author
Irzhak, D. ; Roshchupkin, Dmitry ; Ortega, L.
Author_Institution
X-ray Acoustooptics Lab., IMT, Chernogolovka, Russia
fYear
2013
fDate
21-25 July 2013
Firstpage
220
Lastpage
223
Abstract
Using x-ray diffraction technique temperature dependence of SAW excitation frequency was measured for temperature range from 20 to 400 °C. Crystal lattice deformation caused by SAW propagation was calculated.
Keywords
X-ray diffraction; acoustic wave propagation; crystal structure; deformation; gallium compounds; lanthanum compounds; surface acoustic waves; La3Ga5SiO14; SAW excitation frequency; SAW propagation; X-ray diffraction; crystal lattice deformation; lanthanum gallium silicate crystal; surface acoustic wave; temperature 20 degC to 400 degC; temperature dependence; Crystals; Diffraction; Lattices; Surface acoustic waves; Temperature measurement; X-ray diffraction; Langasite; Surface acoustic wave; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location
Prague
ISSN
1948-5719
Print_ISBN
978-1-4673-5684-8
Type
conf
DOI
10.1109/ULTSYM.2013.0057
Filename
6724814
Link To Document