DocumentCode :
3091568
Title :
Temperature dependence of X-ray diffraction on lanthanum-gallium silicate crystal modulated by surface acoustic wave
Author :
Irzhak, D. ; Roshchupkin, Dmitry ; Ortega, L.
Author_Institution :
X-ray Acoustooptics Lab., IMT, Chernogolovka, Russia
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
220
Lastpage :
223
Abstract :
Using x-ray diffraction technique temperature dependence of SAW excitation frequency was measured for temperature range from 20 to 400 °C. Crystal lattice deformation caused by SAW propagation was calculated.
Keywords :
X-ray diffraction; acoustic wave propagation; crystal structure; deformation; gallium compounds; lanthanum compounds; surface acoustic waves; La3Ga5SiO14; SAW excitation frequency; SAW propagation; X-ray diffraction; crystal lattice deformation; lanthanum gallium silicate crystal; surface acoustic wave; temperature 20 degC to 400 degC; temperature dependence; Crystals; Diffraction; Lattices; Surface acoustic waves; Temperature measurement; X-ray diffraction; Langasite; Surface acoustic wave; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location :
Prague
ISSN :
1948-5719
Print_ISBN :
978-1-4673-5684-8
Type :
conf
DOI :
10.1109/ULTSYM.2013.0057
Filename :
6724814
Link To Document :
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