DocumentCode :
3091596
Title :
Calibration and Debugging of Multi-step Analog to Digital Converters
Author :
Zjajo, Amir ; de Gyvez, Jose Pineda
Author_Institution :
JNXP Semicond. Res., Eindhoven
fYear :
2008
fDate :
23-25 Jan. 2008
Firstpage :
512
Lastpage :
515
Abstract :
This paper reports a new approach for debugging of the analog to digital converters based on process monitoring and extended design-for-test implementation. The circuit is re-configured in such a way that all sub-blocks are analysed and tested for their full input range allowing full observability and controllability of the analog to digital converter. To set initial data, estimate the parameter update and to guide the test, dedicated monitors have been designed. Additionally, the second presented algorithm allow circuit calibration without explicit need for any dedicated test signal nor requires a part of the conversion time. It works continuously and with every signal applied to the ADC.
Keywords :
analogue-digital conversion; calibration; design for testability; process monitoring; circuit reconfiguration; design-for-test implementation; multi-step analog to digital converter calibration; process monitoring; Analog-digital conversion; Calibration; Circuit testing; Debugging; Design for testability; Electronic equipment testing; Logic testing; Matrix converters; Quantization; Switches; calibration; debugging; design-for-test; multi-step ADC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
Type :
conf
DOI :
10.1109/DELTA.2008.82
Filename :
4459604
Link To Document :
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