• DocumentCode
    3091596
  • Title

    Calibration and Debugging of Multi-step Analog to Digital Converters

  • Author

    Zjajo, Amir ; de Gyvez, Jose Pineda

  • Author_Institution
    JNXP Semicond. Res., Eindhoven
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    512
  • Lastpage
    515
  • Abstract
    This paper reports a new approach for debugging of the analog to digital converters based on process monitoring and extended design-for-test implementation. The circuit is re-configured in such a way that all sub-blocks are analysed and tested for their full input range allowing full observability and controllability of the analog to digital converter. To set initial data, estimate the parameter update and to guide the test, dedicated monitors have been designed. Additionally, the second presented algorithm allow circuit calibration without explicit need for any dedicated test signal nor requires a part of the conversion time. It works continuously and with every signal applied to the ADC.
  • Keywords
    analogue-digital conversion; calibration; design for testability; process monitoring; circuit reconfiguration; design-for-test implementation; multi-step analog to digital converter calibration; process monitoring; Analog-digital conversion; Calibration; Circuit testing; Debugging; Design for testability; Electronic equipment testing; Logic testing; Matrix converters; Quantization; Switches; calibration; debugging; design-for-test; multi-step ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.82
  • Filename
    4459604