DocumentCode
3091596
Title
Calibration and Debugging of Multi-step Analog to Digital Converters
Author
Zjajo, Amir ; de Gyvez, Jose Pineda
Author_Institution
JNXP Semicond. Res., Eindhoven
fYear
2008
fDate
23-25 Jan. 2008
Firstpage
512
Lastpage
515
Abstract
This paper reports a new approach for debugging of the analog to digital converters based on process monitoring and extended design-for-test implementation. The circuit is re-configured in such a way that all sub-blocks are analysed and tested for their full input range allowing full observability and controllability of the analog to digital converter. To set initial data, estimate the parameter update and to guide the test, dedicated monitors have been designed. Additionally, the second presented algorithm allow circuit calibration without explicit need for any dedicated test signal nor requires a part of the conversion time. It works continuously and with every signal applied to the ADC.
Keywords
analogue-digital conversion; calibration; design for testability; process monitoring; circuit reconfiguration; design-for-test implementation; multi-step analog to digital converter calibration; process monitoring; Analog-digital conversion; Calibration; Circuit testing; Debugging; Design for testability; Electronic equipment testing; Logic testing; Matrix converters; Quantization; Switches; calibration; debugging; design-for-test; multi-step ADC;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location
Hong Kong
Print_ISBN
978-0-7695-3110-6
Type
conf
DOI
10.1109/DELTA.2008.82
Filename
4459604
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