• DocumentCode
    309181
  • Title

    A new design-for-reliability approach to thermal fatigue life prediction of leadless solder joints

  • Author

    Pao, Y.-H. ; Jih, E. ; Liu, R. ; Siddapureddy, V. ; Song, X. ; McMillan, R. ; Hu, J.M.

  • Author_Institution
    Res. Lab., Ford Motor Co., Dearborn, MI, USA
  • fYear
    1997
  • fDate
    9-12 Mar 1997
  • Firstpage
    130
  • Lastpage
    133
  • Abstract
    Summary form only given. While a tremendous amount of work has been done in leadless solder joint reliability, the detailed thermal fatigue failure mechanisms and their relations with key parameters, e.g., solder fillet, inner end geometry, and microstructure, have, however, not yet been fully understood. Also life prediction methodologies that account for the physics of failure still remain to be developed. In this paper the failure mechanisms of 2512 LCR solder joints are discussed based on thermal fatigue test results, and reliability models for fatigue crack initiation and propagation and the effect of solder height are elaborated
  • Keywords
    circuit reliability; failure analysis; fatigue cracks; life testing; packaging; printed circuit manufacture; reliability theory; soldering; thermal stress cracking; thermal stresses; 2512 LCR solder joints; design-for-reliability approach; failure mechanisms; fatigue crack initiation; fatigue crack propagation; inner end geometry; leadless solder joints; microstructure; reliability models; solder fillet; solder height; solder joint reliability; thermal fatigue life prediction; thermal fatigue test results; Capacitive sensors; Failure analysis; Fatigue; Lead; Metallization; Resistors; Soldering; Surface cracks; Testing; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials. Proceedings., 3rd International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-7803-3818-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.1997.581276
  • Filename
    581276