DocumentCode :
309181
Title :
A new design-for-reliability approach to thermal fatigue life prediction of leadless solder joints
Author :
Pao, Y.-H. ; Jih, E. ; Liu, R. ; Siddapureddy, V. ; Song, X. ; McMillan, R. ; Hu, J.M.
Author_Institution :
Res. Lab., Ford Motor Co., Dearborn, MI, USA
fYear :
1997
fDate :
9-12 Mar 1997
Firstpage :
130
Lastpage :
133
Abstract :
Summary form only given. While a tremendous amount of work has been done in leadless solder joint reliability, the detailed thermal fatigue failure mechanisms and their relations with key parameters, e.g., solder fillet, inner end geometry, and microstructure, have, however, not yet been fully understood. Also life prediction methodologies that account for the physics of failure still remain to be developed. In this paper the failure mechanisms of 2512 LCR solder joints are discussed based on thermal fatigue test results, and reliability models for fatigue crack initiation and propagation and the effect of solder height are elaborated
Keywords :
circuit reliability; failure analysis; fatigue cracks; life testing; packaging; printed circuit manufacture; reliability theory; soldering; thermal stress cracking; thermal stresses; 2512 LCR solder joints; design-for-reliability approach; failure mechanisms; fatigue crack initiation; fatigue crack propagation; inner end geometry; leadless solder joints; microstructure; reliability models; solder fillet; solder height; solder joint reliability; thermal fatigue life prediction; thermal fatigue test results; Capacitive sensors; Failure analysis; Fatigue; Lead; Metallization; Resistors; Soldering; Surface cracks; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials. Proceedings., 3rd International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-7803-3818-9
Type :
conf
DOI :
10.1109/ISAPM.1997.581276
Filename :
581276
Link To Document :
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